唐叔贤
校长学勤讲座教授
博士（加州大学欧文分校）
理学硕士（加州大学欧文分校）
理学学士（香港大学）
唐叔贤教授，1964年毕业于香港大学，1967、1969年分别获加州大学硕士、博士学位。1997年，唐教授获裘槎优秀科研者奖。2001年当选中国科学院院士，同年当选美国物理学会Fellow。2010年当选世界科学院院士。2011年入选深圳市高层次专业人才杰出人才。
唐叔贤教授是世界著名的材料表面科学与技术专家，发展了固体中电子的多重散射理论体系，在低能电子衍射（LEED）、光电子衍射（PHD）、高分辨电子能量损失谱（HREELS）以及反射高能电子衍射（RHEED）等技术测量结果的定量分析上做出了创造性的系统贡献。由于在表面衍射和光谱学多重散射理论方面的贡献。此外，在先进材料生长上开展了氮化镓在碳化硅衬底上的生长研究，并探讨了氮化镓的异质生长机制。
唐叔贤教授从2015年任香港中文大学（深圳）研究生院院长，2011-2014年任南方科技大学领军教授、学术委员会主席、教授会主席、物理系主任和致仁书院院长。2004至2014年任中国科学技术大学微尺度物质科学国家实验室主任。2004至2009年任香港城市大学常务副校长，2002-2003年任香港城市大学副校长（学术），1994至2001年出任香港大学物理系系主任及讲座教授，1988至2000年任美国威斯康星州立大学物理杰出讲座教授，1988-2000年任美国国家自然科学基金会项目主任、1986年当选为美国真空学会主席、1990年当选美国总统杰出青年研究学者评委，1993年任英国皇家杰出讲座教授。在美期间，曾任加州大学（Berkeley），Arizona State大学，欧州Arhus University等大学的客座教授。
唐叔贤教授著书6本，在国际高水平学术期刊发表文章280多篇，当中包括：2篇《Science》文章、2篇《Physics Today》文章、1篇《Advances in Physics》文章、1篇《Progress in Surface Science》文章、1篇《Proceedings of National Academy of Sciences》文章、35篇《Physical Review Letters》文章。唐叔贤教授在1979年出版的专著《Surface Crystallography by Low-Energy Electron Diffraction（表面晶体学的低能电子衍射方法）》，成为表面结构领域的权威刊物。在1991年，唐教授把电子全息方法引进表面物理领域，该技术获批1992年美国专利。
唐教授自1974年以来，承担美国和中国香港地区科研项目20项，作为项目负责人（PI）承担18项国际科研项目。其中作为项目负责人承担美国科研项目13项，包括1974年到1994年期间承担7项美国国家科学基金会项目，1979年至1994年期间承担5项美国能源部项目，1990年至1993年间承担1项美国海军研究局项目。在1988年至1989年期间，作为美国国家科学基金会材料研究部凝聚态理论项目的主任。
作为项目负责人承担6项中国香港地区科研项目，作为主要参与人承担2项香港地区科研项目。其中分别在1995年7月至1998年12月和2003年7月至2006年11月作为项目负责人主持中国香港研究资助局2项团队项目，在2001年12月至2003年11月主持中国香港研究资助局联合科研基金项目1项，分别在1996年10月至1999年9月、2001年9月至2003年8月、2002年9月至2006年8月主持3项优配研究金项目。2016-17为中国科学院学部学科发展战略研究项目（低维度人工微结构及其界面和表面科学）的负责人。
更新于2017年8月
a) Books
1) Surface Crystallography by Low-Energy Electron Diffraction, M.A. Van Hove and S.Y. Tong, Springer-Verlag, Heidelberg, 1979. (Times Cited: 902)
2) Quantum Physics and Chemistry of Solids, eds. R. Vanselow and S.Y. Tong, CRC Press, NY, 1977. (Times Cited: 34)
3) The Structure of Surfaces-I, eds. M.A. Van Hove and S.Y. Tong, Springer-Verlag, Heidelberg, 1985. (Times Cited: 72)
4) The Structure of Surfaces III, eds. S.Y. Tong, M.A. Van Hove, X. Xie and K. Takayanagi, Springer-Verlag, Berlin, 1991. (Times Cited: 24)
5) Atomic-Scale Imaging of Surfaces and Interfaces, eds. D.K. Biegelsen, D.J. Smith and S.Y. Tong, Materials Research Society, Vol. 295, 1993. (Times Cited: 9)
6) The Structure of Surfaces-IV, eds. X. Xie, S.Y. Tong and M.A. Van Hove, World Scientific, NJ (1994). (Times Cited: 29)
b) Reviews
7) Physics Today: "Structure Analysis of Solid Surfaces", T.N. Rhodin and S.Y. Tong, 28, 10 (1975). (Times Cited: 22)
8) Comments on Solid State Physics: "Reliability of Low-Energy Electron Diffraction as a Tool for Surface Crystallography", S.Y. Tong, 9, 1 (1978).
9) Progress in Surface Science: "Theory of Low-Energy Electron Diffraction and Its Application", S.Y. Tong, 7, 1 (1975), Pergamon, Oxford. (Times Cited: 100)
10) Critical Reviews of Solid State Sciences: "Diffraction Effects in Angle-Resolved Ultraviolet Photoemission Spectroscopy", S.Y. Tong, 10, 209 (1981), CRC Press. (Times Cited: 9)
11) Proceedings of the National Academy of Sciences: "Fourier Transform Analysis of NPD Data for Surface Structure Determination", Z. Hussain, D.A. Shirley, C.H. Li, and S.Y. Tong, 78, 5293 (1981). (Times Cited: 37)
12) Physics Today: "Exploring Surface Structure", S.Y. Tong, 37, 50 (1984). (Times Cited: 21)
13) "Surface Science: Recent Progress and Perspectives, Part I", eds. R. Vanselow and S.Y. Tong, CRC Press, USA, 1976. (Times Cited: 19)
14) "Surface Science: Recent Progress and Perspectives, Part II", eds. R. Vanselow and S.Y. Tong, CRC Press, USA, 1976. (Times Cited: 19)
15) "Surface Science: Recent Progress and Perspectives, Part III", eds. R. Vanselow and S.Y. Tong, CRC Press, USA, 1976. (Times Cited: 19)
16) "Electron Dichroism Studies of Magnetic Structure Using Circularly-Polarized X-Rays", J.G. Tobin, G.D. Waddill, D.P. Pappas, E. Tamura, P.A. Sterne, X. Guo and S.Y. Tong, Spectroscopy, 10, 30 (1995), cover article. (Times Cited: 5)
17) "Auger Electron Angular Distributions from Surfaces: Forward Focusing or Silhouettes?", X.D. Wang, Z.L. Han, B.P. Tonner, Y. Chen, S.Y. Tong, Science, 248, 1129 (1990). (Times Cited: 23)
18) "Inversion of Low-energy Electron Diffraction Data with No Pre-knowledge Factor – Beyond Optical Holography", S.Y. Tong, Advances in Physics, 48, 135 (1999). (Times Cited: 12)
19) "Magnetic X-ray Circular Dichroism in Photoelectron Spectroscopy and Diffraction", J/G. Tobin, G.D. Waddill, E. Tamura, P. Sterne, P.J. Bedrossian, D.P. Pappas, X. Guo and S.Y. Tong, Surf. Rev. Lett. 3, 1429 (1996). (Times Cited: 11)
20) “納米科學和技術的二次浪潮”,唐叔賢,京港學術交流,Vol. 54, No. 6 (2002).
(Times Cited: 2)
21) ”Nanoscience and Technology – the Second Revolution”, Proceedings of the Chinese Academy of Sciences, June, 2002.
c) Chapters in Books
22) "Inelastic Scattering of Light by Charge Density Fluctuations in a Superconductor", S.Y. Tong and A.A. Maradudin, Raman Festschrift, ed. J. Willis, Pergamon, New York, 1969.
23) "Vibrations of Atoms in Crystal Surfaces", A.A. Maradudin and S.Y. Tong, The Structure and Chemistry of Solid Surfaces, John Wiley, New York, 1969.
24) "Computation Methods of Low-Energy Electron Diffraction", N. Stoner, M.A. Van Hove and S.Y. Tong, Advances in Characterization of Metal and Polymer Surfaces, ed. M. Lee, Academic Press, New York, 1977.
25) "Surface Structure of Reconstructed GaAs(110)", 7th IVC and 3rd ICSS, vol. 3, page 2407 (1977).
26) "A Review of Surface Crystallography by LEED", S.Y. Tong, Electron Diffraction 1927-77, ed. P.J. Dobson et al., The Institute of Physics Press, London, 1978.
27) "Surface Structural Techniques: LEED and Angle-Resolved Photoemission Spectroscopy", S.Y. Tong, Modern Problems of Surface Physics, I. Lalov, 1981, BAS Press.
28) "The Inelastic Scattering of Low-Energy Electrons by Surface Excitations: Basic Mechanisms", D.L. Mills and S.Y. Tong, Springer Series in Chemical Physics, vol. 20, ed. R. Vanselow, Springer-Verlag, NY (1982).
29) "Diffraction Effects in Angle-Resolved Photoemission Spectroscopy", S.Y. Tong and C.H. Li, Chemistry and Physics of Solid Surfaces, ed. R. Vanselow and W. England, CRC Press, Inc., Florida (1982).
30) "Low-Energy Electron-Diffraction Study of the (2x2)GaAs(111) Surface", G. Xu, Y. Huang, W.N. Mei, B.W. Lee and S.Y. Tong, in 17th ICPS, eds, J.D. Chadi and W.A. Harrison, Springer-Verlag, Heidelberg (1985).
31) "The Geometric Structure of (2x2) GaAs(111) Surface", G. Xu, S.Y. Tong and W.N. Mei, in The Structure of Surfaces, eds. S.Y. Tong and M.A. Van Hove, Springer-Verlag (1985).
32) "Electron-Phonon Scattering and Structure Analysis", M. Rocca, H. Ibach, S. Lehwald, M.L. Xu, B.M. Hall and S.Y. Tong, in The Structure of Surfaces, eds. S.Y. Tong and M.A. Van Hove, Springer-Verlag, NY (1985).
33) "Computation Procedure of the Combined Space Method", M.A. Van Hove and S.Y. Tong, in Determination of Surface Structure by LEED, eds. P.M. Marcus and F. Jona, Plenum Press, NY (1985).
34) "The Structure of Surfaces", S.Y. Tong, M.W. Puga, H.C. Poon, and M.L. Xu in Springer Series in Chemical Physics, eds. R. Vanselow and R. Howe, Springer-Verlag, Heidelberg, (1986).
35) "The Study of Surface Phonons by Electron Energy Loss Spectroscopy: Theoretical and Experimental Considerations", D.L. Mills, S.Y. Tong and J.E. Black, in Surface Phonons, eds. F. de Wette and W. Kress, Springer-Verlag, Heidelberg (1986).
36) "Theoretical Aspects of Electron Energy Loss Spectroscopy", D.L. Mills and S.Y. Tong, Phil. Trans. R. Soc. London, A318, 179 (1986).
37) "Scattering Potentials for Surface Diffraction Spectroscopies", X.J. Wu, M.W. Puga, and S.Y. Tong, Reviews in Surface Physics, ed. X.D. Xide, WSP, (1987).
38) "The Geometric Structure of the GaAs(111) and (110) Surfaces", S.Y. Tong, W.N. Mei, G. Xu in Gallium Arsenide, J.S. Blackmore, AIP press, NY (1987).
39) "Accurate Dynamical Theory for RHEED Rocking-Curve Intensity Spectra", S.Y. Tong, T.C. Zhao and H.C. Poon, in RHEED and Reflection Electron Imaging of Surfaces, eds. P.K. Larsen and P.J. Dobson, Plenum Press, NY (1988).
40) "Bonding and Structure on Semiconductor Surfaces", S.Y. Tong, H. Huang, C.M. Wei, in Chemistry & Physics of Solid Surfaces, Vol. 8, R. Vanselow and R. Howd, eds., Springer-Verlag, Berlin (1990).
41) "Angular Diffraction Patterns of Photoelectrons and Auger Electrons From Single-Crystal Cu(111)", X.D. Wang, Y. Chen, Z.L. Han, S.Y. Tong, B.P. Tonner, in The Structure of Surfaces III, eds. S.Y. Tong et al., Springer, Heidelberg (1991).
42) "The Study of Surface Phonons by Electron Energy Loss Spectroscopy: Theoretical and Experimental Considerations", D.L. Mills, S.Y. Tong, J.E. Black, in Surface Phonons, ed. W. Kress, Springer, Heidelberg (1991).
43) "New Method for a Lensless Electron Microscopy: Achieving High Resolution and Overcoming Effects of Multiple Scattering", S.Y. Tong, H. Huang and Hua Li., eds. T.C. Haug, P.I. Cohen, and D.J. Eaglesham, MRS Symp. Series 208, 13 (1991).
44) "Photoelectron Diffraction of Magnetic Ultrathin Films: Fe/Cu(001)", J.G. Tobin, M.K. Wagner, X.Q. Guo and S.Y. Tong, Mat. Res. Soc. Symp. Series 208, 283 (1991).
45) "Forward Focusing Photoelectron Diffraction –A New Structural Tool for Surfaces and Interfaces", S.Y. Tong, Y. Chen, Hua Li and C.M. Wei, in Surface Physics, eds. X. Li et al., Gordon and Breach Science Publishers, Philadelphia (1992).
46) "Experimental Optimization for Imaging with Photoelectron Diffraction", J.G. Tobin, G.D. Waddill, Hua Li and S.Y. Tong, Materials Research Society, Vol. 295 (1993).
47) "Electron-Diffraction for Surface Studies - The First 30 Years", S.Y. Tong, in Surface Science, ed. C.B. Duke, 299/300, 358, North-Holland, The Netherlands (1994).
48) "Imaging of Surface Structure with Energy-Dependent Photoelectron Diffraction" J.G. Tobin, G.D. Waddill, Hua Li and S.Y. Tong, in The Structure of Surfaces-IV, eds. X. Xie, S.Y. Tong, and M.A. Van Hove, 29-38, World Scientific, NJ (1994).
49) "Vibrational and Excitational Properties of Surfaces", R.F. Wallis and S.Y. Tong, in Physics of Solid Surfaces, ed. G. Chiarotti, Landolt-Bornstein Series, Springer (1994).
50) "The Nature of Bonding on Metal-Semiconductor Interfaces", H. Over and S.Y. Tong, in Handbook of Surface Science, eds. S. Holloway and N.V. Richardson, Elsevier, Netherlands (1996).
d) Journal Publications
51) "Normal Modes of a Semi-Infinite Ionic Crystal", S.Y. Tong and A.A. Maradudin, Phys. Rev. 181, 1318 (1969). (Times Cited: 112)
52) "Saxon-Hunter Theorem for One Dimensional General Alloys", B.Y. Tong and S.Y. Tong, Phys. Rev. 180, 739 (1969). (Times Cited: 15)
53) "The Interaction of Photons and Phonons With Crystal Surfaces", A. Grimm, A.A. Maradudin and S.Y. Tong, Journal de Physique, C1, 9 (1970). (Times Cited: 3)
54) "Interpretation of Low-Energy Electron-Diffraction Spectra for a Free-Electron Metal in Terms of Multiple Scattering Involving Strong Inelastic Damping", S.Y. Tong and T.N. Rhodin, Phys. Rev. Lett. 26, 711 (1971). (Times Cited: 88)
55) "LEED Spectra Study of Temperature Effects in Crystalline Xenon Surfaces", A. Ignatiev, T.N. Rhodin, S.Y. Tong, B.I. Lundquist and J.B. Pendry, Solid State Comm. 9, 1851 (1971). (Times Cited: 21)
56) "Phase Transfer Theory and Its Application to Long Chain Molecules: DNA", B.Y. Tong and S.Y. Tong, J. Chem. Phys. 54, 1317 (1971). (Times Cited: 12)
57) "New Perturbation Approach to the Theory of Low-Energy Electron-Diffraction The t-Matrix Formalism", R.H. Tait, S.Y. Tong and T.N. Rhodin, Phys. Rev. Lett. 28, 553 (1972). (Times Cited: 51)
58) "Absolute Intensity-Energy LEED Spectra for Clean Nickel (001) Surface", J.E. Demuth, S.Y. Tong and T. N. Rhodin, Journal of Vac. Sci. and Tech. 9, 639 (1972). (Times Cited: 16)
59) “LEEd Thermal Scattering Studies of XE( 111) Surfaces”, A. Ignatjev, S. Y. Tong, T. N. Rhodin, B. I. Lundqvis, J. B. Pendry, Journal of Vacuum Science & Technology 9, 720 (1972)
60) "t-Matrix Approach in Low-Energy Electron-Diffraction", S.Y. Tong, T.N. Rhodin and R.H. Tait, Phys. Rev. B8, 421 (1973). (Times Cited: 27)
61) "Application of the t-Matrix Perturbation Method to the Analysis of Low-Energy Electron- Diffraction Spectra for Aluminum", S.Y. Tong, T.N. Rhodin and R.H. Tait, Phys. Rev. B8, 430 (1973). (Times Cited: 27)
62) "Layer-Dependent Surface Mean-Square Vibration Amplitudes by Low-Energy Electron-Diffraction", S.Y. Tong, T.N. Rhodin and A. Ignatiev, Phys. Rev. B8, 906 (1973). (Times Cited: 23)
63) "t-Matrix Formalism of Low-Energy Electron-Diffraction for Clean and Overlayer Systems", S.Y. Tong, T.N. Rhodin and R.H. Tait, Surface Sci. 34, 457 (1973). (Times Cited: 22)
64) "The 3-d Electronic Band Calculation of Nickel, The Extended Juckel Method", C.C. Wan and S.Y. Tong, Surface Sci. 34, 739 (1973). (Times Cited: 12)
65) "Intensity-Energy Spectra for Nickel Using an Exact Multiple Scattering Method With Layer-Dependent Vibration Amplitudes", S.Y. Tong and L.L. Kesmodel, Phys. Rev. B8, 3753 (1973). (Times Cited: 43)
66) "Convergence Comparisons of the Third-Order t-Matrix Method With An Exact Multiple Scattering Method", S.Y. Tong, G.E. Laramore and T.N. Rhodin, Phys. Rev. B8, 536l (1973). (Times Cited: 7)
67) "Low-Energy Electron-Diffraction Investigation of the Krypton (111) Surface", A. Ignatiev, T.N. Rhodin and S.Y. Tong, Surface Sci. 42, 37 (1974). (Times Cited: 22)
68) "Layer Iteration Calculation of Low-Energy Electron Diffraction", S.Y. Tong, Solid State Comm. 16, 91 (1975). (Times Cited: 23)
69) "Chemisorption Bond-Length and Binding Location of p (2x1) Oxygen on W(110) Using a Convergent, Perturbative, Low-Energy-Electron-Diffraction Calculation", M. Van Hove and S.Y. Tong, Phys. Rev. Lett. 35, 1092 (1975). (Times Cited: 101)
70) "Chemisorption Bond Lengths of Chalcogen Overlayers at a Low Coverage by Convergent Perturbation Methods", M. Van Hove and S.Y. Tong, Jour. of Vac. Sci. and Tech. 12, 230 (1975). (Times Cited: 191)
71) "Accurate Interpretation of LEED Intensity Spectra of a Layered Transition-Metal Dichalcogenide Compound", B.J. Mrstik, S.Y. Tong, R. Kaplan and A.K. Ganguly, Solid State Comm. 17, 755 (1975). (Times Cited: 17)
72) "Possible Ni(001) Surface Expansion Due to Carbon Chemisorption Predicted by LEED Calculations", M. Van Hove and S.Y. Tong, Surface Sci. 52, 673 (1975). (Times Cited: 18)
73) "A Study of Ion-Core Potentials Used in Low-Energy Electron Diffraction Calculations", S.Y. Tong, J.B. Pendry and L.L. Kesmodel, Surface Sci. 54, 21 (1976). (Times Cited: 28)
74) "Surface Structures of W(100) and W(100) Faces by the Dynamical LEED Approach", M. Van Hove and S.Y. Tong, Surface Sci. 54, 91 (1976). (Times Cited: 106)
75) "Perturbation Calculations of the c(2x2) Sodium Overlayer Structure on Al(00l)", M. Van Hove, S.Y. Tong, and N. Stoner, Surface Sci. 54, 259 (1976). (Times Cited: 70)
76) "Surface Structures Determination of the Layered Compounds MoS2 and NbSe2 by the Dynamical LEED Approach ", S.Y. Tong, M. Van Hove, B.J. Mrstik, R. Kaplan, and T. Reinecke, Jour. of Vac. Sci. and Tech. 13, 188 (1976). (Times Cited: 2)
77) "Layer Iteration Calculation of Angle-Resolved Ultraviolet Photoemisson: c(2x2) Oxygen Overlayer on Ni(001)", S.Y. Tong and M.A. Van Hove, Solid State Comm. 19, 543 (1976). (Times Cited: 36)
78) "Determination of the Surface Structure of Layered Compounds by Low-Energy Electron Diffraction", B.J. Mrstik, R. Kaplan, T. L. Reinecke, M. Van Hove and S.Y. Tong, Nuovo Cimento 38, 387 (1977). (Times Cited: 21)
79) "Surface Contraction of Clean W(100) Face", B.W. Lee, A. Ignatiev, S.Y. Tong and M. Van Hove, Journal of Vac. Sci. and Tech. 14, 291 (1977). (Times Cited: 106)
80) "Surface-Structures Determination of the Layered Compounds MoS2 and NbSe2 by Low-Energy Electron Diffraction", B.J. Mrstik, R. Kaplan, T.L. Reinecke, M. Van Hove and S.Y. Tong, Phys. Rev. B15, 897 (1977). (Times Cited: 64)
81) "Surface Structure Refinements of 2H-MoS2, 2H-NbSe2, and W(100)p(2x1)-O via New Reliability Factors of Surface Crystallography", M. Van Hove, S.Y. Tong and M.H. Elconin, Surface Sci. 64, 85 (1977). (Times Cited: 229)
82) "A Unified Computation Scheme of Low-Energy Electron Diffraction The Combined Space Method", S.Y. Tong and M.A. Van Hove, Phys. Rev. B16, 1459 (1977). (Times Cited: 92)
83) "Dynamical Calculation of Angle Resolved UPS - c(2x2) O-Ni(001) and S-Ni(001)", S.Y. Tong, C.H. Li and A.R. Lubinsky, Phys. Rev. Lett. 39, 498 (1977). (Times Cited: 55)
84) "Surface Bond Angle and Bond Lengths of Rearranged GaAs(110)", S.Y. Tong, A.R. Lubinsky, B.J. Mrstik and M.A. Van Hove, Phys. Rev. B17, 3303 (1978). (Times Cited: 192)
85) "Multiple Scattering Approach of Angle-Resolved Photoemission", C.H. Li, A.R. Lubinsky and S.Y. Tong, Phys. Rev. B17, 3128 (1978). (Times Cited: 92)
86) "Extraction of Surface Structural Information From Angle-Resolved UPS", C.H. Li and S.Y. Tong, Phys. Rev. Lett. 40, 46 (1978). (Times Cited: 92)
87) "Dynamical Calculations of LEED for Incommensurate Lattices - Xe on Ag(111)", N. Stoner, M.A. Van Hove, S.Y. Tong, and M.B. Webb, Phys. Rev. Lett. 40, 243 (1978). (Times Cited: 41)
88) "Substrate Effects of Angle Resolved Ultraviolet Photoemission Spectroscopy", S.Y. Tong and N. Stoner, J. Phys. C11, 3511 (1978). (Times Cited: 17)
89) "Structure of the Si(001) 2xl Surface- Studied by Low Energy Electron Diffraction", S.Y. Tong and A.L. Maldonado, Surface Sci. 78, 459 (1978). (Times Cited: 68)
90) "Analysis of Resonancelike Peaks in Angle-Resolved Ultraviolet Photoemission Spectroscopy From Absorbed Atoms", C.H. Li and S.Y. Tong, Phys. Rev. B19, 1769 (1979). (Times Cited: 34)
91) "Binding-Site Determination from Angle-Resolved Ultraviolet Photoemission Intensity Modulations—Classification of Initial States into Two Types", C.H. Li and S.Y. Tong, Phys. Rev. Lett. 42, 901 (1979). (Times Cited: 56)
92) "Resonancelike Peaks in Angle-Resolved Ultraviolet Photoemission of Adsorbed Species", S.Y. Tong and C.H. Li, J. of Vac. Sci. and Tech. 16, 652 (1979). (Times Cited: 3)
93) "Selective Structural Sensitivity and Simplified Computations of Angle-Resolved Ultraviolet Photoemission Spectroscopy," C. H. Li and S. Y. Tong, Phys. Rev. Lett. 43, 526 (1979). (Times Cited: 42)
94) "Atomic Structure of Clean and Arsenic Covered GaAs(110) Surfaces", B.J. Mrstik, S.Y. Tong and M.A. Van Hove, J. Vac. Sci. and Tech. 16, 1258 (1979). (Times Cited: 26)
95) "The Structure of c(2x2) CO on Ni(001) by LEED", S.Y. Tong, C.H. Li and A.L. Maldonado, Surface Sci. 94, 73 (1980). (Times Cited: 83)
96) "Inelastic Scattering of Electrons from Adsorbate Vibrations: Large Angle Reflections", S.Y. Tong, C.H. Li and D.L. Mills, Phys. Rev. Lett. 44, 407 (1980). (Times Cited: 136)
97) "Theory of Large Angle Inelastic Scattering of Electrons by Adsorbate Vibrations", C.H. Li, S.Y. Tong and D.L. Mills, Phys. Rev. B21, 3057 (1980). (Times Cited: 134)
98) "Azimuthal Dependence of Angle-Resolved Photoelectron Diffraction From I-Ag(111)", W.M. Kang, C.H. Li and S.Y. Tong, Solid State Comm. 36, 149 (1980). (Times Cited: 30)
99) "Inelastic Scattering of Electrons by Adsorbate Vibrations in the Impact Scattering Regime: CO on Ni(001) as an Example", S.Y. Tong, C.H. Li and D.L. Mills, Phys. Rev. B24, 806 (1981). (Times Cited: 64)
100) "Normal Photoelectron Diffraction of c(2x2) 0(1s) and S(2p) on Ni(001), with Fourier-Transform Analysis ", D.H. Rosenblatt, J.G. Tobin, M.G. Mason, R.F. David, S.D. Kevan, D.A. Shirley, C.H. Li and S.Y. Tong, Phys. Rev. B23, 3828 (1981). (Times Cited: 103)
101) "Structural Determination of Molecular Overlayer Systems With NPD", S.D. Kevan, R.F. Davis, J.G. Tobin, D.A. Shirley, C.H. Li and S.Y. Tong, Phys. Rev. Lett. 46, 1629 (1981). (Times Cited: 89)
102 "Angular Orientation of NH on Ni(111) by Photoelectron Scattering", W.M. Kang, C.H. Li and S.Y. Tong, Phys. Rev. Lett. 47, 931 (1981). (Times Cited: 31)
103) "Direct Data Reduction of NPD Curves by Fourier Transformation", S.Y. Tong and J.C. Tang, Phys. Rev. B25, 6526 (1982). (Times Cited: 21)
104) "The Image Potential Barrier for Large Angle Inelastic Electron Scattering From Surfaces", B.M. Hall and S.Y. Tong, J. Vac. Sci. Tech. 20, 578 (1982). (Times Cited: 2)
105) "The Binding Distance of c(2x2) O on Ni(001)", S.Y. Tong and K.H. Lau, Phys. Rev. B25, 7382 (1982). (Times Cited: 38)
106) "Normal Photoelectron Diffraction Studies of Selenium and Sulphur Overlayers on Ni(00l) and Ni(111)", D.H. Rosenblatt, S.D. Kevan, J.G. Tobin, D.A. Shirley, Y. Huang, and S.Y. Tong, Phys. Rev. B26, 1812 (1982). (Times Cited: 42)
107) "Off-Normal Photoelectron Diffraction Study of the c(2x2) Se-Ni(001) System", D.H. Rosenblatt, S.D. Kevan, J.G. Tobin, D.A. Shirley, J.C. Tang and S.Y. Tong, Phys. Rev. B26, 3181 (1982). (Times Cited: 160)
108) "Normal Photoelectron Diffraction of 0/Cu(001)", J.G. Tobin, D.H. Rosenblatt, R.F. Davis, D.A. Shirley, Y. Huang, W.M. Kang and S.Y. Tong, Phys. Rev. B26, 7076 (1982). (Times Cited: 77)
109) "Photoelectron Diffraction of Layered Compound Sb Te Se", R. Benbow, Z. Hurich, K.H. Lau and S.Y. Tong, Phys. Rev. B28, 4160 (1983). (Times Cited: 8)
110) "Photoelectron Diffraction Analysis of the Structure of c(2x2) O on Ni(001)", S.Y. Tong, W.M. Kang, D.H. Rosenblatt, J.G. Tobin and D.A. Shirley, Phys. Rev. B27, 4632 (1983). (Times Cited: 42)
111) "Large Angle Electron Energy Loss Spectroscopy With a Surface Image Potential", B.M. Hall, S.Y. Tong and D.L. Mills, Phys. Rev. Lett. 50, 1277 (1983). (Times Cited: 37)
112) "Multilayer Reconstruction of the (2x2) GaAs(111) Surface", S.Y. Tong, G. Xu, and W.N. Mei, J. Vac. Sci. Tech. 2, 863 (1984). (Times Cited: 1)
113) "Vacancy-bulking Model for the (2x2) GaAs(111) Surface", S.Y. Tong, G. Xu and W.N. Mei, Phys. Rev. Lett. 52, 1693 (1984). (Times Cited: 178)
114) "The Geometric Structures of the GaAs(111) and (110) Surfaces", S.Y. Tong and W.N. Mei and G. Xu, Journal Vac. Science and Technol. 2, 393 (1984). (Times Cited: 81)
115) "Focusing and Diffraction Effects in Angle-Resolved X-ray Photoelectron Spectroscopy", H.C. Poon and S.Y. Tong, Phys. Rev. B30, 6211 (1984). (Times Cited: 193)
116) "Energy Dependence of Inelastic Electron Scattering Cross Section by Surface Vibrations", M.L. Xu, B.M. Hall, S.Y. Tong, M. Rocca, H. Ibach, S. Lehwald, J.E. Black, Phys. Rev. Lett. 54, 1171 (1985). (Times Cited: 92)
117) "Multilayer Relaxation for Clean Ni(110) Surface", M.L. Xu and S.Y. Tong, Physical Review B31, 6332 (1985). (Times Cited: 79)
118) "Importance of Multiple Forward Scattering in Medium-and High-Energy Electron Emission and/or Diffraction Spectroscopies", S.Y. Tong, H.C. Poon, and D.R. Snider, Phys. Rev. B32, 2096 (1985). (Times Cited: 187)
119) "Vacancy Buckling Model for the (111) Surface of III-V Compound Semiconductors", S.Y. Tong, G. Xu, W.Y. Hu, and M.W. Puga, Jour. of Vac. Sci. B3, 1076 (1985). (Times Cited: 32)
120) "The Surface Geometry of GaAs(110)", M.W. Puga, G. Xu, and S.Y. Tong, Surface Sci. Lett., 164, L789 (1985). (Times Cited: 50)
121) "Multiple-Scattering Theory of Low-Energy Electron Diffraction for a Nonspherical Scattering Potential", Seido Nagano and S.Y. Tong, Phys. Rev. B32, 6562 (1985). (Times Cited: 32)
122) "Cross-section Calculations of Inelastic Electron-Phonon Scattering for Surface Modes of Ni(001)", S.Y. Tong, M.L. Xu and B.M. Hall, Jour. of Vac. Sci. A3, 1452 (l985). (Times Cited: 3)
123) "The Atomic Geometry of the (2x2) GAP (111) Surface", G. Xu, W.Y. Hu, M.W. Puga, S.Y. Tong, J.L. Yen, S.R. Wang, B.W. Lee, Phys. Rev. Rapid Commun. B32, 8473 (1985). (Times Cited: 38)
124) "Adsorption of c(2x2) O on Ni(001): An Off-Normal Direction Energy-Dependent Photoelectron-Diffraction Study", W.N. Mei and S.Y. Tong, Phys. Rev. B33, 1408 (1986). (Times Cited: 1)
125) "Small-atom Approximation in Forward- and Back- Scattering Photoelectron Spectroscopies", H.C. Poon, D. Snider and S.Y. Tong, Phys. Rev. B33, 2198 (1986). (Times Cited: 45)
126) "The Structure of Overlayer Adsorption on Ni(001) by High-Resolution Electron-Energy Loss-Spectroscopy", M.L. Xu, S.Y. Tong, Jour. of Vac. Sci. A4, 1302 (1986). (Times Cited: 3)
127) "Cross-Section Analysis of Surface and Bulk Phonons by Electron Scattering from Cu(001)", L.L. Kesmodel, M.L. Xu and S.Y. Tong, Phys. Rev. Rapid Commun., B34, 2010 (1986). (Times Cited: 30)
128) "Azimuthal Dependence of Angle-Resolved Photoemission Cross-Section from Adsorbate- Induced Initial States", A.A. Maradudin and S.Y. Tong, Phys. Rev. B34, 3678 (1986). (Times Cited: 3)
129) "Inelastic Electron Scattering of Surface and Bulk Phonons on Cu(001)-p(2x2) S", Z.Q. Wu, M.L. Xu, Y. Chen, S.Y. Tong, M.H. Mohamed, and L.L. Kesmodel, Phys. Rev. Rapid Commun. B36, 9329 (1987). (Times Cited: 13)
130) "Two-Dimensional Boundary Conditions and Finite Size Effects in Angle-Resolved Photoelectron Emission Spectroscopy, LEED and HREELS", S.Y. Tong and H.C. Poon, Phys. Rev. B37, 2884 (1988). (Times Cited: 6)
131) "Surface Structure Analysis Using Reflection High Energy Electron Diffraction", K.D. Jamison, D.N. Zhou, P.I. Cohen, T.C. Zhao and S.Y. Tong, J. Vac. Sci. Technol. A6(3), 611 (1988). (Times Cited: 4)
132) "Low-Energy Electron-Diffraction Analysis of the Si(111) 7x7 Structure", S.Y. Tong, H. Huang, C.M. Wei, W.E. Packard, F.K. Men, G. Glander and M.B. Webb, J. Vac. Sci. Technol. A6(3), 615 (1988). (Times Cited: 179)
133) "Atomic Geometry of Si(111) 7x7 by Dynamical Low-Energy Electron Diffraction", H. Huang, S.Y. Tong, W.E. Packard and M.B. Webb, Phys. Letters A 130(3), 166 (1988). (Times Cited: 46)
134) "Multiple Scattering Analysis of Reflection High-Energy Electron Diffraction Intensities from GaAs(110)", S.Y. Tong, T.C. Zhao, H.C. Poon, K.D. Jamison, D.N. Zhou and P.I. Cohen, Phys. Letters A128(8), 447 (1988). (Times Cited: 5)
135) "Characterization of Surface and Resonance Phonons for the Ni(100) - c(2x2)S System", Y. Chen, Z.Q. Wu, M.L. Xu, S.Y. Tong, K.M. Ho and X.W. Wang, Phys. Review B 37, 9978 (1988). (Times Cited: 5)
136) "Role of Adsorption Site on Electron-Energy-Loss Cross Sections of Single-Layer Substrate Modes", S.Y. Tong, Y. Chen, and Z.Q. Wu, Phys. Rev. B 38, 2192 (1988). (Times Cited: 2)
137) "Dynamical Calculation of RHEED Rocking Curves for Ag(001) and Pt(111)", T.C. Zhao and S.Y. Tong, Ultramicroscopy 26, 151 (1988). (Times Cited: 27)
138) "Invariant-Embedding R-Matrix Scheme for Reflection High-Energy Electron Diffraction", T.C. Zhao, H.C. Poon and S.Y. Tong, Physical Review B38(2), 1172 (1988). (Times Cited: 98)
139) "Adsorption Distance of S on Ni(001): An Electron-Energy-Loss-Spectroscopy Cross-Section Analysis of the Ni(001-c(2x2)S system", Z.Q. Wu, Y. Chen, M.L. Xu and S.Y. Tong, Phys. Rev. B39(5), 3116 (1989). (Times Cited:24)
140) "Vibrational Properties of Epitaxial Films on Metals. I. Fcc Ni on the Ni(001) Surface", S.Y. Tong, Y. Chen, J.M. Yao, and Z.Q. Wu, Phys. Rev. B 39(9), 5611 (1989). (Times Cited: 9)
141) "Vibrational Properties of Epitaxial Films on Metals. II. Fcc Ni on the Cu(001) Surface", Y. Chen, Z.Q. Wu, J.M. Yao, and S.Y. Tong, Phys. Rev. B 39(9), 5617 (1989). (Times Cited: 7)
142) "A Comparison of Green's Function and Slab Methods of Calculating Surface Vibration Spectral Densities: p(2x2)O on Ni(100) as an Example", Y. Chen, Z.Q. Wu, and S.Y. Tong, Sur. Sci. 210, 271-281 (1989). (Times Cited: 6)
143) "Observation and Structural Determination of ()R30° Reconstruction of the Si(111) Surface", W.C. Fan, A. Ignatiev, H. Huang, and S.Y. Tong, Phys. Rev. Letters 62(13), 1516 (1989). (Times Cited: 70)
144) "The First Interlayer Spacing of Ta(100) Determined by Photoelectron Diffraction", R.A. Bartynski, D. Heskett, K. Garrison, G. Watson, D.M. Zehner, W.N. Mei, S.Y. Tong, and X. Pan, J. Vac. Sci. Technol. A 7(3), 1931 (1989). (Times Cited: 47)
145) "Quantitative Structural Determination of Metallic Film Growth on a Semiconductor Crystal: ()R30° T (1x1)Pb on Ge(111)", H. Huang, C.M. Wei, H. Li, B.P. Tonner, and S.Y. Tong, Phys. Rev. Letters 62(5), 559 (1989). (Times Cited: 67)
146) "The First Interlayer Spacing of Ta(100) Determined by Photoelectron Diffraction", R.A. Bartynski, D. Heskett, K. Garrison, G. Watson, D.M. Zehner, W.N. Mei, S.Y. Tong and X. Pan, Phys. Rev. B40, 5340 (1989). (Times Cited: 47)
147) "Atomic Structure of Si(111)-()R30°-Al Studied by Dynamical Low-Energy Electron Diffraction", H. Huang, S.Y. Tong, W.S. Yang, H.D. Shih, F. Jona, Phys. Rev. B42, 7483 (1990). (Times Cited: 72)
148) "Atomic Structure of Si(111) ()R30°-B by Dynamical Low-Energy Electron Diffraction", H. Huang, S.Y. Tong, J. Quinn, F. Jona, Phys. Rev. B41, 3276 (1990). (Times Cited: 90)
149) "Surface-Phonon Dispersion of NiAl(110)", M. Wuttig, W. Hoffmann, E. Preuss, R. Franchy, H. Ibach, Y. Chen, M.L. Xu, S.Y. Tong, Phys. Rev. B42, 5443 (1990). (Times Cited: 23)
150) "Electron-Energy-Loss Cross-Section and Surface Lattice-Dynamics Studies of NiAl(110)", Y. Chen, M.L. Xu, S.Y. Tong, M. Wuttig, W. Hoffmann, R. Franchy, H. Ibach, Phys. Rev. B42, 5451 (1990). (Times Cited: 16)
151) "Detection of Odd Symmetry Shear Modes at Metal Surfaces by Inelastic Electron Scattering: Experiment and Theory", J.L. Erskine, E.J. Jeong, J. Yater, Y. Chen, S.Y. Tong, J. Vac. Sci. Tech. A8, 2649 (1990). (Times Cited: 17)
152) "The Structure of Si(111)()R30°-Ag, Reply Comment", Phys. Rev. Lett. 64, 492 (1990). (Times Cited: 2)
153) "Quantitative Structural Determination of Metallic Film Growth on a Semiconductor Crystal, Reply Comment", H. Huang, C.M. Wei, B.P. Tonner, S.Y. Tong, Phys. Rev. Lett. 64, 1183 (1990). (Times Cited: 67)
154) "Growth of Co Layers on Cu(111) Studied by Forward-Focusing Angle-Resolved X-Ray Photoemission Spectroscopy and Real-Space Imaging", C.M. Wei, T.C. Zhao, S.Y. Tong, Phys. Rev. Lett. 65, 2278 (1990). (Times Cited: 63)
155) "Adsorption Geometry of (2x1) Na on Si(001)", C.M. Wei, H. Huang, S.Y. Tong, G. Glander, M.B. Webb, Phys. Rev. B42, 11284 (1990). (Times Cited: 46)
156) "Angle-Resolved X-Ray Photoemission Spectroscopy from HCP Co(0001): Forward-Focusing and Atomic Imaging", C.M. Wei, T.C. Zhao, S.Y. Tong, Phys. Rev. B43, 6354 (1991). (Times Cited: 13)
157) "Characterization of Surface Phonons on Cu(001) and Ag(001): First-Principles Phonon Calculations With Experimental and Theoretical Studies of High-Resolution Electron-Energy- Loss Spectra", Y. Chen, S.Y. Tong, Jae-Sun Kim, L.L. Kesmodel, T. Rodach, K.P. Bohnen and K.M. Ho, Phys. Rev. B44, 11394 (1991). (Times Cited: 45)
158) "Energy-Extension in 3-Dimensional Atomic Imaging by Electron Emission Holography", S.Y. Tong, Hua Li and H. Huang, Phys. Rev. Lett. 67, 3102 (1991). (Times Cited: 143)
159) "High-Resolution Electron Energy-Loss Spectroscopy Analysis of Ag(001): Discovery of a New Surface Longitudinal Mode Using First-Principles Phonon Calculations", Y. Chen, S.Y. Tong, M. Rocca, P. Moretto, U. Valbusa, K.P. Bohnen and K.M. Ho, Surface Science Lett. 250, L389 (1991). (Times Cited: 23)
160) "Phase Shift Correction in 3-Dimensional Imaging Using Forward-Scattering Photoemission and Auger Spectroscopies", S.Y. Tong, C.M. Wei, T.C. Zhao, H. Huang, Hua Li, Phys. Rev. Lett. 66, 60 (1991). (Times Cited: 110)
161) "The Registry of Honeycombs in the Structure of Si(111) ()R30°-Ag", S.Y. Tong, H. Huang, Surface Science Lett. 243, L46 (1991). (Times Cited:9)
162) "Surface Phonons and Structure and Epitaxial Nickel Layers on Cu(001)", Y. Chen, S.Y. Tong, Jae-Sung Kim, M.H. Mohamed, L.L. Kesmodel, Phys. Rev. B (Rapid Communications) 43, 6788 (1991). (Times Cited: 23)
163) "Three-Dimensional Imaging of Atoms Using Source Waves From Deeply Buried Atoms and Overcoming Multiple-Scattering Effects", H. Huang, Hua Li and S.Y. Tong, Phys. Rev. B44, 3240 (1991). (Times Cited: 52)
164) "Principles of Energy Extension in Electron-Emission Holography", S.Y. Tong, Hua Li, and H. Huang, Phys. Rev. B46, 4155 (1992). (Times Cited: 27)
165) "Momentum-Space Images of Surface Dimers on GaAs(001)-(2x4) by High-Energy Auger and X-ray Photoelectron Diffraction", S.A. Chambers, V.A. Loek, Hua Li and S.Y. Tong, J. Vac. Sci. and Technol. B10, 2092 (1992). (Times Cited: 13)
166) "Method for Spatially Resolved Imaging of Energy-Dependent Photoelectron Diffraction", S.Y. Tong, H. Huang and C.M. Wei, Phys. Rev. B46, 2452 (1992). (Times Cited: 117)
167) "Direct Atomic Structure by Holographic Diffuse LEED", C.M. Wei and S.Y. Tong, Surface Sci. Lett. 274, L577 (1992). (Times Cited: 56)
168) "Low-Energy Electron and Low-Energy Positron Holography", S.Y. Tong, H. Huang and X.Q. Guo, Phys. Rev. Lett. 69, 3654 (1992). (Times Cited: 37)
169) "Forward-Focusing and Shadowing Effects in Solids", Hua Li and S.Y. Tong, Surface Science Letters 281, L347 (1993). (Times Cited: 9)
170) "R-matrix Method for Calculating Wavefunctions in Reflection High-Energy Electron Diffraction", T.C. Zhao and S.Y. Tong, Phys. Rev. B47, 3923 (1993). (Times Cited: 20)
171) "Imaging Atoms in Surface Dimers of GaAs(001) c(2x80)/(2x4) by Electron-Emission Holography", Hua Li and S.Y. Tong, Surface Sci. 282, 380 (1993). (Times Cited: 15)
172) "New Experimental Technique for Determining Real-Space Atomic Images Applied to Aluminum Adsorbed on Silicon (111)", H. Wu, G.J. Lapeyre, H. Huang and S.Y. Tong, Phys. Rev. Lett. 71, 251 (1993). (Times Cited: 88)
173) "Imaging of a Surface Alloy with Energy-Dependent Photoelectron Holography", J.G. Tobin, G.D. Waddill, Hua Li and S.Y. Tong, Phys. Rev. Lett. 70, 4150 (1993). (Times Cited: 56)
174) "First-Principles Phonon and Multiple-Scattering Electron-Energy-Loss-Spectra Studies of Cu(111) and Ag(111)", Y. Chen, S.Y. Tong, K.P. Bohnen, T. Rodach and K.M. Ho, Phys. Rev. Lett. 70, 603 (1993). (Times Cited: 50)
175) "Low-Energy Electron Diffraction as a Direct Identification Technique: Atomic Structures of Ag- and Li-induced Si(111)-()R30°", H. Over, H. Huang, S.Y. Tong, W.C. Fan and A. Ignatiev, Phys. Rev. B48, 15353 (1993). （Times Cited: 34）
176) "Direct Atomic Structure by Multiple-energy Inversion of Experimental Forward-scattering-photoelectron and Auger-electron-diffraction Data", Hua Li, S.Y. Tong, D. Naumovic, A. Stuck and J. Osterwalder, Phys. Rev. B47, 10036 (1993). （Times Cited: 24）
177) "Atomic Geometry of Ge(111)R30°- Ag Determined by LEED", H. Huang, H. Over, S.Y. Tong, J. Quinn and F. Jona, Phys. Rev. B49, 13483 (1994). （Times Cited: 43）
178) "Direct Structural Determination by Inversion of Experimental Diffuse LEED Intensities", C.M. Wei, S.Y. Tong, K. Heinz, H. Wedler, M.A. Mendez and K. Heinz, Phys. Rev. Lett. 72, 2434 (1994). （Times Cited: 57）
179) "Dynamical Effects in RHEED Diffraction Intensity Oscillations", T.C. Zhao, A. Ignatiev and S.Y. Tong, Surf. Rev. Lett. 1, 253 (1994).
180) "The Structure and Lattice Dynamics of Unreconstructed fcc(001) and (111) Metal Surfaces", S.Y. Tong, Y. Chen, K.P. Bohnen, T. Rodach and K.M. Ho, Surf. Rev. Lett. 1, 97 (1994). （Times Cited: 17）
181) "Atomic Structure of Si(113) 3x1-H by Dynamical Low-Energy Electron Diffraction Intensity Spectra Analysis", H. Huang, S.Y. Tong, U. Myler and K. Jacobi, Surf. Rev. Lett. 1, 221 (1994). （Times Cited: 18）
182) "Determination of Linear-Chain Multiple Bound State Resonances in Reflection High-Energy Electron Diffraction", T.C. Zhao, S.Y. Tong and A. Ignatiev, Surf. Rev. Lett. 1, 261 (1994).
183) "Surface Crystallography by Inverting Diffraction Spectra", S.Y. Tong, Hua Li, H. Huang and J.G. Tobin, Surf. Rev. Lett. 1, 303 (1994). （Times Cited: 2）
184) "Fingerprinting Technique in Low-Energy Electron Diffraction", H. Over, M. Gierer, H. Bludau, G. Ertl and S.Y. Tong, Surf. Sci. 314, 243 (1994). （Times Cited: 38）
185) "Spin-polarized Photoelectron Diffraction Using Circularly Polarized X-Rays", G.D. Waddill, J.G. Tobin, X. Guo and S.Y. Tong, Phys. Rev. B, 50, 6774 (1994). （Times Cited: 27）
186) "Spin-Specific Photoelectron Diffraction Using Magnetic X-Ray Circular Dichroism", J.G. Waddill, X. Guo and S.Y. Tong, J. Appl. Phys. 76, 6465 (1994). （Times Cited: 2）
187) "Initial-State and Scattering-Factor Effects in Photoelectron Holography", S.Y. Tong, Hua Li and H. Huang, Phys. Rev. B, 51, 1850 (1995). （Times Cited: 39）
188) "A Structural Determination using Magnetic X-Ray Circular Dichroism in Spin-Polarized Photoelectron Diffraction", G.D. Waddill, J.G. Tobin, X. Guo and S.Y. Tong, Vacuum, 46, 1233 (1995).
189) "Refinement of the Si(111)-()R30°-Ag Structure by Low-Energy Electron Diffraction", H. Over, S.Y. Tong, J. Quinn and F. Jona, Surf. Rev. Lett. 2, 451 (1995). （Times Cited: 34）
190) "Spin Specific Photoelectron Diffraction, Photoelectron Spectroscopy, and Absorption Using Magnetic X-Ray Circular Dichroism", J.G. Tobin, G.D. Waddill, D.P. Pappas, E. Tamura, P.A. Sterne, X. Guo and S.Y. Tong, J. Vac. Sci. Tech. A, 13, 1534 (1995). （Times Cited: 4）
191) "Photoelectron Diffraction Imaging of a Surface Alloy", J.G. Tobin, G.D. Waddill, Hua Li and S.Y. Tong, Surf. Sci. 334, 263 (1995). （Times Cited: 6）
192) "Magnetic X-Ray Circular Dichroism in Spin-Polarized Photoelectron Diffraction", G.D. Waddill, J.G. Tobin, X. Guo and S.Y. Tong, Mat. Res. Soc. Symp. Proc., 375, 101 (1995). （Times Cited: 11）
193) "Surface Structure of Epitaxial Gd(0001) Films on W(110) Studied by Quantitative LEED Analysis", J. Giergiel, A.W. Pang, H. Hopster, X. Guo, S.Y. Tong and D. Weller, Phys. Rev. B, 51, 10201 (1995). （Times Cited: 16）
194) "Direct Observation of Ordered Trimers on Si(111)R30°-Au by Scanned-Energy Glancing-Angle Kikuchi Electron Wavefront Reconstruction", I.H. Hong, D.K. Liao, Y.C. Chou, C.M. Wei and S.Y. Tong, Phys. Rev. B, 54, 4762 (1996). （Times Cited: 30）
195) "Probing Surface and Thin Film Magnetic Structure With Circularly-Polarized Synchrotron Radiation", G.D. Waddill, J.G. Tobin, X. Guo and S.Y. Tong, J. Vac. Sci. Technol. B, 14, 3152 (1996). （Times Cited: 3）
196) "Angle-resolved X-ray Circular and Magnetic Circular Dichroisms: Definitions and Applications", S.Y. Tong, X. Guo, J.G. Tobin and G.D. Waddill, Phys. Rev. B, 54, 15356 (1996). （Times Cited: 4）
197) "Low Energy Electron Holograms - Properties and Method of Inversion", S.Y. Tong, T.P. Chu, H.S. Wu and H. Huang, Surf. Rev. Lett. 4, 459 (1997). （Times Cited: 7）
198) "Role of Scattering Factor Anisotropy in Electron, Positron and Photon Holography", S.Y. Tong, C.W. Mok, Huasheng Wu and L.Z. Xin, Phys. Rev. B 58, 10815 (1998). （Times Cited: 10）
199) "Time-Reversed Int. Source Holography", S.Y. Tong and H. Huang, Surf. Rev. Lett. 5, 971 (1998). （Times Cited: 10）
200) "Methods in Angle-Resolved Photoelectron Diffraction: Slab Method Versus Cluster Approach", Huasheng Wu, C.Y. Ng, T.P. Chu, and S.Y. Tong, Phys. Rev. B57, 15476 (1998). （Times Cited: 10）
201) "LEED Analysis of Ultra-thin Ag-Films on W(110)", H.C. Poon, S.Y. Tong, W.F. Chung and M.S. Altman, Surf. Rev. Lett. 5, 1143 (1998). （Times Cited: 11）
202) "Advances in Direct and Diffraction Methods for Surface Structural Determination", S.Y. Tong, Surf. Sci., 433-435, 32 (1999). （Times Cited: 2）
203) "Convergent N2 Scaling Iterative Method of Photoelectron Diffraction and LEED for Ordered or Disordered Systems", Huasheng Wu and S.Y. Tong, Phys. Rev. B, 59, 1657 (1999). （Times Cited: 13）
204) "Multilayer Structural Determination of the GaAs (-1-1-1) (2x2) Reconstruction by Automated Tensor Low Energy Electron Diffraction", B.C. Deng, Z.X. Yu, G. Xu, B.J. Mrstik and S.Y. Tong, Phys. Rev. B 59, 9775 (1999). （Times Cited: 7）
205) "Anisotropic Step-flow Growth and Island Growth of GaN(0001) by Molecular Beam Epitaxy", M.H. Xie, S.M. Seutter, W.K. Zhu, L.X. Zheng, Huasheng Wu and S.Y. Tong, Phys. Rev. Lett. 82, 2749 (1999). （Times Cited: 150）
206) "Step Bunching of Vicinal GaN(0001) Surfaces during Molecular Beam Epitaxy", M.H. Xie, S.H. Cheung, L.X. Zheng, Y.F. Ng, Huasheng Wu, N. Ohtani and S.Y. Tong, Phys. Rev. B 61, 9983 (2000). （Times Cited: 21）
207) "Reflection High-energy Electron Diffraction Intensity Oscillations during Growth of GaN(0001)A by Plasma-assisted Molecular Beam Epitaxy", S.M. Seutter, M.H. Xie, W.K. Zhu, L.X. Zheng, H.S. Wu and S.Y. Tong, Surf. Sci. Lett. 445, L71 (2000). （Times Cited: 36）
208) "Adsorption and Desorption Kinetics of Gallium Atoms on 6H-SiC(0001) Surfaces", L.X. Zheng, M.H. Xie and S.Y. Tong, Phys. Rev. B 61, 4890 (2000). （Times Cited: 38）
209) "Reduction of Threading Defects in GaN Grown on Vicinal SiC(0001) by Molecular-beam Epitaxy", M.H. Xie, L.X. Zheng, S.H. Cheung, Y.F. Ng, Huasheng Wu, S.Y. Tong and N. Ohtani, Appl. Phys. Lett. 77, 1105 (2000). （Times Cited: 62）
210) "Observation of "Ghost" Islands and Surfactant Effect of Surface Gallium Atoms during GaN Growth by Molecular Beam Epitaxy", L.X. Zheng, M.H. Xie, S.M. Seutter, S.H. Cheung and S.Y. Tong, Phys. Rev. Lett. 85, 2352-2355 (2000). （Times Cited: 33）
211) "A Comparison of Angular Behaviors among Electrons, Positrons and Photon Scattering Factors", S.Y. Tong and C.W. Mok, Surf. Rev. Lett. 7, 333 (2000). （Times Cited: 2）
212) "Linear Low Energy Positron Diffraction (LLEPD) for the Si(111) 2x1 Pi-Chain Model", S.Y. Tong, Surf. Rev. Lett. 7, 21 (2000). （Times Cited: 2）
213) "The Atomic Structure of Si(111)-()R30-Ga Determined by Automated Tensor LEED", Wenhua Chen, Huasheng Wu, Wing Kin Ho, B.C. Deng, Geng Xu and S.Y. Tong, Surf. Rev. Lett. 7, 267 (2000). （Times Cited: 10）
214) "Why is the Positron an Ideal Particle for Studying Surface Structure?", S.Y. Tong, Surf. Sci. Lett. 457, L432 (2000). （Times Cited: 7）
215) "Surface Morphology of GaN: Flat versus Vicinal Surface", M.H. Xie, S.M. Seutter, L.X. Zheng, S.H. Cheung, Y.F. Ng, H.S. Wu and S.Y. Tong, Internet J. on Nitride Research 5S1, W3.29 (2000).
216) "Current-induced Migration of Surface Adatoms during GaN Growth by Molecular Beam Epitaxy", L.X. Zheng, M.H. Xie, S.J. Xu, S.H. Cheung, and S.Y. Tong, Journal of Crystal Growth 227, 376-380 (2001) （Times Cited: 6）
217) "Initial Stage of GaN Growth and Its Implication to Defect Formation in Film", S.H. Cheung, L.X. Zheng, M.H. Xie and S.Y. Tong, Physics Review B.64, 033304 (2001). （Times Cited: 23）
218) "Defect States in Cubic GaN Epilayer Grown on GaAs by Metalorganic Vapor Phase Epitaxy", S.J. Xu, C.T. Or, Q. Li, L.X. Zheng, M.H. Xie, S.Y. Tong and H. Yang, Phys. Stat. Sol. (a) 188, 681 (2001) （Times Cited: 2）
219) "Thermal redistribution of Localized Excitons and its Effect on the Luminescence Band in InGaN Ternary Alloys", Q. Li, S.J. Xu, W.C. Cheng, M.H. Xie, S.Y. Tong, C.M. Che and H. Yang, Appl. Phys. Lett. 79, 1810 (2001) （Times Cited: 119）
220) "GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy", Y.F. Hu, Y.Y. Shen, C.D. Beling, S. Fung, M.H. Xie, S.H. Cheung, J. Tu, G. Brauer, W. Anwand and S.Y. Tong, Mater. Sci. Forum 363-365, 478 (2001)
221) "Direct Inversion of Low-energy Electron Diffraction (LEED) IV Spectra: the Surface Patterson Function", S.Y. Tong and Huasheng Wu, J. Phys.: Condens. Matter 13 1 (2001) （Times Cited: 5）
222) "Rocombination Mechanism of Anti-stokes Photoluminescence in Partially Ordered GaInP-GaAs Heterostructure", S.J. Xu, Q. Li, H. Wang, M.H. Xie, S.Y. Tong andJ-R. Dong, Proc. 25th Int. Conf. Phys. Semicond., Osaka 2000, Springer, Berlin, 2001, p595.
223) "Surface Patterson Function by Inversion of Low Energy Electron Diffraction IV Spectra at Multiple Incident Angles", Huasheng Wu and S.Y. Tong, Phys. Rev. Lett. 87, 036101 (2001). （Times Cited: 31）
224) "Quantum Size Effect in Low Energy Electron Diffraction of Thin Films", M.S. Altman, W.F. Chung, Z.Q. He, H.C. Poon and S.Y. Tong, Appl. Surf. Sci. 169, 82 (2001). （Times Cited: 39）
225) "What Causes Step Bunching – Negative Ehrlich-Schwoebel Barrier versus Positive Incorporation Barrier", M.H. Xie, S.Y. Leung and S.Y. Tong, Surf. Sci. Lett. 515, L459 (2002) (Times Cited: 22)
226) "Growth and Structural Properties of GN Films on Flat and Vicinal SiC(0001) Substrates", M.H. Xie, S.H. Cheung, L.X. Zheng, S.Y. Tong, B. S. Zhang and H. Yang, J. Mod. Phys. B 16, 165 (2002) (Times Cited: 1)
227) "Nanoscience and Nanotechnology : the Second Revolution", S.Y. Tong, World Sci-Tech R & D 24, 1 (2002)
228) "Surface Atomic Arrangement Visualization via Reference-Atom-Specific Holography", Huasheng Wu, Shihong Xu, Simon Ma, W.P. Lau, M.H. Xie and S.Y. Tong, Phys. Rev. Lett. 89, 216101 (2002). (Times Cited: 15)
229) "Growth Mode and Strain Evolution During InN Growth on GaN(0001) by Molecular-beam Epitaxy", Y.F. Ng, Y.G. Cao, M.H. Xie, X.L. Wang and S.Y. Tong, Appl. Phys. Lett. 81, 3960 (2002). (Times Cited: 96)
230) "Comparative Study on the Broadening of Exciton Luminescence Linewidth Due to Phonon in Zinc-blende and Wurtzite GaN Epilayers", S.J. Xu, L.X. Zheng, S.H. Cheung, M.H. Xie and S.Y. Tong, Appl. Phys. Lett. 81, 4389 (2002). (Times Cited: 24)
231) "Strong Screening Effect of Photo-generated Carriers on Piezoelectric Field in In0.13Ga0.87N/In0.03Ga0.97N Quantum Wells", Q. Li, X.J. Xu, M.H. Xie, S.Y. Tong, X.H. Zhang, W. Liu and S.J. Chua, Japanese Journal of Applied Physics Part 2- Letters 41, L1093 (2002). (Times Cited: 20)
232) "Evidence for a Type-II Band Alignment between Cubic and Hexagonal Phases of GaN", X.H. Lu, P.Y. Yu, L.X. Zheng, S.J. Xu, M.H. Xie and S.Y. Tong, Appl. Phys. Lett. 82, 1033 (2003). (Times Cited: 29)
233) "Direct Observation of Ga Adlayer on GaN(0001) Surface by LEED Patterson Function", S.H. Xu, Huasheng Wu, X.Q. Dai, W.P. Lau, L.X. Zheng, M.H. Xie and S.Y. Tong, Phys. Rev. B. 67, 125409 (2003). (Times Cited: 22)
234) "Large Excitation-power Dependence of Pressure Coefficients of of InxGa1-xN/ InyGa1-yN Quantum Wells", Q. Li, Z.L. Fang, S.J. Xu, G.H. Li, M.H. Xie, S.Y. Tong, X.H. Zhang, W. Liu and S.J. Chua, Phys. Stat. Sol. (b) 235, 427 (2003) (Times Cited: 1)
235) "Layer Spacings in Coherently Strained Epitaxial Metal Films", W.F. Chung, Y.J. Feng, H.C. Poon, C.T. Chan, S.Y. Tong and M.S. Altman, Phys. Rev. Lett. 90, 216105 (2003) (Times Cited: 33)
236) "Small-Diameter Silicon Nanowire Surfaces", D.D.D. Ma, C.S. Lee, F.C.K. Au, S.Y. Tong and S.T. Lee, Science 299, 1874 (2003) (Times Cited: 1,143)
237) "Stress and its Effect on Optical Properties of GaN Epilayers Grown on Si(111), 6H-SiC(0001), and c-plane Sapphire", D.G. Zhao, S.J. Xu, M.H. Xie, S.Y. Tong and Hui Yang, Appl. Phys. Lett. 83, 677 (2003) (Times Cited: 341)
238) "Shallow Optically Active Structural Defect in Wurtzite GaN Epilayers Grown on Stepped 4H-SiC Substrates", S.J. Xu, H.J. Wang, S.H. Cheung, Q. Li, X.Q. Dai, M.H. Xie and S.Y. Tong, Appl. Phys. Lett. 83, 3477 (2003) (Times Cited: 10)
239) “InN Island Shape and its Dependence on Growth Condition of Molecular-beam Epitaxy”, Y.G. Cao, M.H. Xie, Y. Liu, Y.F. Ng, H.S. Wu and S.Y. Tong, Applied Physics Letters 83, 5157 (2003) (Times Cited: 46)
240) "Scaling of Three-Dimensional InN Islands Grown on GaN(0001) by Molecular-beam Epitaxy", Y.G. Cao, M.H. Xie, Y. Liu, S.H. Xu, Y.F. Ng, H.S. Wu and S.Y. Tong, Phys. Rev. B. 68, 161304 (2003) (Times Cited: 15)
241) “Structure Determination of the (1x1) GaN(0001) Surface by Quantitative Low-Energy Electron Diffraction”, Z.X. Yu, S.Y. Tong, Shihong Xu, Simon Ma and Huasheng Wu, Surf. Rev. Lett. 10, 831(2003) (Times Cited: 12)
242) “Study of the C2H4 /Si(100)-(2x1) Interface by Derivative Photoelectron Holography”, S.H. Xu, H.S. Wu, S.Y. Tong, M. Keeffe, G.J. Lapeyre and E. Rotenberg, Surf. Rev. Lett. 10, 925 (2003)
243) “Structural Properties of GaN Films Grown on the 6H-SiC(0001) (x) R30o Substrate”, X.Q. Dai, H.S. Wu, S.H. Xu, M.H. Xie and S.Y. Tong, Surf. Rev. Lett. 11, 1 (2004) (Times Cited: 2)
244) “A Model for GaN “Ghost” Islands”, M.H. Xie, L.X. Zheng, X.Q. Dai, H.S. Wu and S.Y. Tong, Surf. Sci. 558, 195 (2004). (Times Cited: 11)
245) “Atomic Structure of the Cleaved Si(111)-(2x1) Surface Refined by Dynamical LEED”, Geng Xu, Bingcheng Deng, Zhaoxian Yu, S.Y. Tong et al. Phys. Rev. B. 70, 045307 (2004) (Times Cited: 18)
246) “Nitrogen Adatom Diffusion on a Ga-Rich GaN(0001) Surface”, X.Q. Dai, H.S. Wu, M.H. Xie, S.H. Xu and S.Y. Tong, Chinese Physics Letters 21, 527 (2004) (Times Cited: 3)
247) “Atomic Design of Polarity of GaN Films Grown on SiC(0001)”, X.Q. Dai, H.S. Wu, S.H. Xu, M.H. Xie and S.Y. Tong, Communications in Theoretical Physics 41, 609 (2004) (Times Cited: 1)
248) “Solvent Dependence of The Evolution of the Surface Morphology of Thin Asymmetric Diblock Copolymer Films”, T. To, H. Wang, A.B. Djurisic, M.H. Xie, W.K. Chan, Z. Xie, C. Wu, S.Y. Tong, Thin Solid Films 467, 59 (2004). (Times Cited: 15)
249) “A Study of InxGa1-xN Growth by reflection high-energy electron diffraction”, Y. Liu, M.H. Xie, Y.G. Cao, H.S. Wu and S.Y. Tong, Journal of Applied Physics, 97, 023502 (2005). (Times Cited: 4)
250) “Coherent And Dislocated Three-dimensional Islands of InGaN Self-assembled On GaN(0001) During Molectular-beam Epitaxy”, Y. Liu, Y.G. Cao, H.S. Wu, M.H. Xie, S.Y. Tong, Physical Review B 71, 153406 (2005). (Times Cited: 4)
251) “In situ Revelation Of a Zinc-blende InN Wetting Layer During Stranski-Krastanov Growth On GaN (0001) By Molecular-beam Expitaxy”, Y.G. Cao, S.H. Xu, W. Lu, X.Q. Dai, Y.F. Chan, N. Wang, Y. Liu, H.S. Wu, M.H. Xie and S.Y. Tong, Physical Review B 71, 155322 (2005) (Times Cited: 3)
252) “Surface Structure Determination by a One-step Search Method for The Deepest Minimun”, Z.Y. Yu and S.Y. Tong, Physical Review B 71, 161404 (2005) (Times Cited: 5)
253) “Ab initio study of indium quantum wire formation on flat and stepped Si(100) surfaces”, X.Q Dai, W.W. Ju, M.H. Xie and S.Y. Tong, Surf. Rev. Lett. 12, 483 (2005) (Times Cited: 2)
254) “A model for steady-state luminescence of localized state ensemble”, Q. Li, S. J. Xu, M. H. Xie and S. Y. Tong, Europhysics Letters, 71, 994-1000 (2005). (Times Cited: 69)
255) “Origin of the “s-shaped” temperature dependence of luminescent peaks from semiconductors”, Q. Li, S. J. Xu, M. H. Xie and S. Y. Tong, Journal of Physics: Condensed Matter 17, 4853-4858 (2005). (Times Cited: 73)
256) “Structures and energetics of hydrogen-terminated silicon nanowire surfaces”, R.Q. Zhang, Y. Lifshitz, D.D.D. Ma, Y.L. Zhao, Th. Frauenheim, S.T. Lee and S.Y. Tong, Journal of Chemical Physics 123, 144703 (2005) (Times Cited: 112)
257) “Structure determination of indium-induced Si(111)-In-4x1 surface by LEED Patterson”, J. Wang, H. S. Wu, R. So, Y. Liu, M. H. Xie and S. Y. Tong, Physical Review B 72, 245324 (2005) (Times Cited: 17)
258) “Spectral features of LO phonon sidebands in luminescence of free excitions in GaN”, S. J. Xu, G. O. Li, S. J. Xiong, S. Y. Tong, C. M. Che, W. Liu and M. F. Li, Journal of Chemical Physics 122, 244712 (2005) (Times Cited: 12)
259) “Origin of triangular island shape and double-step bunching during GaN growth by molecular-beam epitaxy under excess Ga conditions”, M. H. Xie, M. Gong, E. K. Y. Pang, H. S. Wu, S. Y. Tong, Physical Review B 74, 085314 (2006) (Times Cited: 19)
260) “Transition between wurtzite and zinc-blende GaN: An effect of deposition condition of molecular-beam epitaxy”, B. M. Shi, M. H. Xie, H. S. Wu, N. Wang, S.Y. Tong, Applied Physics Letters 89, 151921 (2006) (Times Cited: 31)
261) “Theory of low-energy electron diffraction for detailed structural determination of nanomaterials I – ordered structures”, G. M. Gavaza, Z. X. Yu, L. Tsang, C. H. Chan, S. Y. Tong, M. A. Van Hove, Physical Review B 75, 014114 (2006) (Times Cited: 12)
262) “Efficient Calculation of Electron Diffraction for the Structural Determination of Nanomaterials”, G.M. Gavaza, Z.X. Yu, L. Tsang, C.H. Chan, S.Y. Tong, M.A. Van Hove, Physical Review Letters, Vol. 97, p 055505 (2006) (Times Cited: 13)
263) “Observation of a (root 3 x root 3)-R30 degrees reconstruction on GaN(0001) by RHEED and LEED”, J. Wang, Ricky So, Y. Liu, H. S. Wu, M. H. Xie, S. Y. Tong, Surface Science 600, L169-L174 (2006) (Times Cited:7)
264) “Mass transport and alloying during InN growth on GaN by molecular-beam epitaxy” Y. Liu, M. H. Xie, H. S. Wu, S. Y. Tong, Applied Physics Letters 88, 221916 (2006)
265) “The structure of the CoS2 (100)-(1×1) surface”, Z. X. Yu, M. A. Van Hove, S. Y. Tong, David Wisbey, Ya. B. Losovyj, Ning Wu, M. Manno, L. Wang, C. Leighton, W. N. Mei, and P.A. Dowben, Journal of Physics: Condensed Matter 19, 156223 (2007) (Times Cited: 9)
266) “Theory of low-energy electron diffraction for detailed structural determination of nanomaterials: Finite-size and disordered structures”, G.M. Gavaza, Z.X. Yu, L. Tsang, C.H. Chan, S.Y. Tong, M.A. Van Hove, Physical Review B 75, 235403 (2007) (Times Cited: 12)
267) “Multi-slice finite difference method for full potential calculation of low energy electron diffraction spectra”, H.S. Wu, J. Wang; Ricky So; S.Y. Tong, Journal of Physics:Condensed Matter 19, 386203 (2007) (Times Cited: 6)
268) “Theory of low-energy electron diffraction for nanomaterials – subclusters, automated searches”, G M Gavaza, Z X Yu, M A Van Hove, S Y Tong, Journal of Physics: Condensed Matter 20, 304202 (2008) (Times Cited: 6)
269) H. Xu, R. Q. Zhang, and S. Y. Tong, Phys. Rev. B 82, 155326 (2010). (Times Cited: 10)
270) X. Y. Chen, F. Fang, A. M. C. Ng, A.B. Djurišić, S. Y. Tong, “Growth of triangular ZnO nanorods by electrodeposition”, J. Electrochem. Soc. 157, K269-K272 (2010). (Times Cited: 3)
271) S. Y. Tong, Xu Hu, R. Q Zhang, M. K. Fung, C. T. Yip, A. M. C. Ng, F. Fang,A. B. Djurišić, 2010 3rd IEEE International NanoElectronics Conference Proceedings, P. K. Chu (Editor), IEEE Press (2010), pp 22-23.
272) “Interaction of O2, H2O, N2, and O3 with stoichiometric and reduce ZnO (10(1) over-bar0) surface”. Xu, H, Zhang, R. Q, Tong, S. Y. AMER PHYSICAL SOC, ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA. (2010) (Times Cited: 9)
273) “A standard format for reporting atomic positions: Further needs and options”. Van Hove, MA (Van Hove, M. A.), Hermann, K (Hermann, K.), Watson, PR (Watson, P. R.), Woodruff, DP (Woodruff, D. P.), Tong, SY(Tong, S. Y.), Diehl, RD (Diehl, R. D.), Heinz, K (Heinz, K.), Minot, C (Minot, C.), Tochihara, H (Tochihara, H.). (2010)
274) “Splitting Water on Metal Oxide SurfacesS” Xu, H (Xu, Hu), Zhang, RQ (Zhang, RuiQin), Ng, AMC (Ng, Alan M. C.), Djurisic, AB (Djurisic, Aleksandra B.), Chan, HT (Chan, Hung Tat), Chan, WK (Chan, Wai Kin), Tong, SY (Tong, S. Y.). JOURNAL OF PHYSICAL CHEMISTRY C (2011) (Times Cited: 20)
275) “Interaction of O2 with reduced rutile TiO2(110) surface”. Xu, H, Tong, S. Y. SURFACE SCIENCE (2013)(Times Cited:6)
276) A.M. C. Ng, C. M. N. Chan, M. Y. Guo, Y. H. Leung, A. B. Djurisic, H. Xu, W. K. Chan, F. C. C. Leung, and S. Y. Tong, Antibacterial and photocatalytic activity of TiO2 and ZnO nanomaterials in phosphate buffer and saline solution, Appl. Microbiol Biotechnol 97, 5565 (2013) (Times Cited: 21)
277) “Recovery of clean ordered (111) surface of etched silicon”. Ng, AMC (Ng, A. M. C.), Dong, L (Dong, L.), Ho, WK (Ho, W. K.), Djurisic, AB (Djurisic, A. B.), Xie, MH (Xie, M. H.), Wu, HS(Wu, H. S.), Lin, N (Lin, N.), Tong, SY (Tong, S. Y.) Applied Surface Science (2013) (Times Cited: 1)
278) “Stabilizing forces acting on ZnO polar surfaces: STM, LEED, and DFT”. Xu, H, Dong, L, Shi, XQ, Van Hove, MA Van Hove, Ho, WK, Lin, N, Wu, HS, Tong, SY. PHYSICAL REVIEW B (2014) (Times Cited: 11)
279) J. Fan, J. Z. Zhao, H. Xu*, and S. Y. Tong, Comment on "Interplay between Water and TiO2 Anatase (101) Surface with Subsurface Oxygen Vacancy", Phys. Rev. Lett. 115, 149601 (2015) (Times Cited: 3)
280) “Observation and Analysis of Ordered and Disordered Structures on the ZnO(0001) Polar Surface”. Xu, H, Dong, L, Shi, XQ, Liu, Y, Van Hove, MA, Lin, N, Tong, SY. Journal of PhysicalChemistryC (2016)
281) “Quasi-One-Dimensional Metal-Insulator Transitions in Compound Semiconductor Surfaces”. Zhao, JZ, Fan, W, Verstraete, MJ , Zanolli, Z , Fan, J , Yang, XB , Xu, H , Tong, SY. Physical Review Letters (2016).
